APPPHYS 322: Advanced Topics in X-ray Scattering (PHOTON 322)

Course Description

This course covers advanced topics in x-ray scattering including: diffuse scattering from static and dynamic disorder such as from defects or phonons; inelastic methods such as x-ray Raman and Compton scattering for measuring electronic structure and elementary excitations; and inelastic scattering in the time and frequency domain. Course combines lectures on basic principles with a review of foundational and current literature. May be repeat for credit.